FMICS 2008 - CALL FOR PAPERS

 

Please visit: http://www.dsi.unifi.it/fmics08/

 

13th International ERCIM Workshop on Formal Methods for Industrial Critical Systems 

(FMICS 2008)


September 15-16, 2008,

L’Aquila, Italy

Colocated with ASE 2008 conference

Important dates

Deadline for abstracts

29 May 2008

Deadline for papers

5 June 2008

Accept/Reject Notification

14 July 2008

Final Manuscript for participants proceedings

5 August 2008

Workshop

15-16 September 2008


Scope of the workshop

The aim of the FMICS workshop series is to provide a forum for researchers who are interested in the development and application of formal methods in industry. In particular, these workshops bring together scientists and engineers that are active in the area of formal methods and interested in exchanging their experiences in the industrial usage of these methods. The FMICS workshop series also aims to promote research and development that will improve formal methods and related tools, facilitating their industrial application. Topics include, but are not restricted to:

- Design, specification, code generation and testing based on formal methods

- Verification and validation of complex, distributed, real-time systems and embedded systems

- Verification and validation methods that address shortcomings of existing methods with respect to their industrial applicability (e.g., scalability and usability issues)

- Tools for the development of formal design descriptions

- Case studies and experience reports on industrial applications of formal methods, focusing on lessons learned or identification of new research directions

- Impact of the adoption of formal methods on the development process and associated costs

- Application of formal methods in standardization and industrial forums

Invited speakers

Rance Cleaveland (Univ. of Maryland, USA)

Werner Damm (OFFIS, Germany)

Steven Miller (Rockwell Collins, Advanced Technology Center, USA)

Program committee

Maria Alpuente  (U. Politècnica de Valencia, Spain)

Alvaro Arenas (STFC RAL, UK)

Lubos Brim (Masaryk University, Czech Republic)

Darren Cofer (Rockwell Collins, USA) Co-Chair

Alessandro Fantechi (Univ. di Firenze and ISTI-CNR, Italy) Co-Chair

Wan Fokkink (Vrije Universiteit Amsterdam, Netherlands)

Patrice Godefroid (Microsoft Research, USA)

Leszek Holenderski (Philips Research, Netherlands)

Roope Kaivola (Intel, USA)

Stefan Kowalewski (RWTH Aachen, Germany)

Stefania Gnesi (ISTI-CNR, Italy)

Mark Lawford  (McMaster University, Canada)

Stefan Leue (University of Konstanz, Germany)

Radu Mateescu (INRIA Rhone-Alpes, France)

Charles Pecheur (Universitè Catholique de Louvain, Belgium)

Francois Pilarski (Airbus, France)

Ralf Pinger (Siemens, Germany)

Murali Rangarajan (Honeywell, USA)

Marco Roveri (IRST, Italy)

Ina Schieferdecker (Fraunhofer FOKUS, Germany)

Wilfried Steiner (TTTech, Austria)

Paper submissions

Submissions must be made electronically through the FMICS 2008 Website at URL:

http://senldogo0039.springer-sbm.com/fmics2008/servlet/Conference

Papers should be up to 16 pages in LNCS format, with the names and affiliations of the authors and a clear and informative abstract. Additional details may be included in a clearly marked appendix, which will be read at the discretion of the program committee. All submissions must report on original research.

Submitted papers must not have previously appeared in a journal or conference with published proceedings and must not be concurrently submitted to any other peer-reviewed workshop, symposium, conference or archival journal. Any partial overlap with any such published or concurrently submitted paper must be clearly indicated.

Case study papers should identify lessons learned, validate theoretical results (such as scalability of methods), or provide specific motivation for further research and development.

Publication

Participant's proceedings will be available during the workshop. A post-workshop proceedings volume will be published by Springer Verlag in the Lectures Notes in Computer Science series.